CMI2500 pages
CMI250 ®
250
Advanced coating thickness metrology on ferrous and
non-ferrous substrates and structures
Dual Technology Features Magnetic Induction
and Eddy Current Measurement Techniques with
Statistical Analysis and PC Interface
The CMI250 is a feature rich instrument built upon our
established Eddy Current / Magnetic Induction Dual Probe
Technology. The instrument offers factory and user
calibrations, automatic temperature compensation, base
corrections, measurement storage options, date and time
stamping, statistical analysis, and USB PC connectivity.
Useful in a wide variety of settings, the CMI250 measures
non-conductive coatings over non-ferrous substrates and
non-magnetic coatings over ferrous substrates.
This small but rugged, versatile, single-handed gauge equipped
with a lanyard carry-case for portability is durably designed and
temperature- compensating, enabling its use in the harshest
of conditions. The unit is factory calibrated and only requires
a swift base re-zero correction when measuring on different
metallic substrates. For advanced applications the unit may
also be user calibrated. The CMI250 is a high-quality, feature
rich, yet economically designed complete Coating Thickness
measurement package.