Digital Modules for Boundary
Scan Parallel I/O Access
Via Rocca di Papa, 21 –00179 Roma, Italy
Email: info@geb-enterprise.com - Web: www.geb-enterprise.com
Model: BSPIO-78TTLU
Features
78 LVTTL I/O channels for logic drive and sense
High reliability DIN41612 I/O connector
Reliable screw lock brackets
Size 122mm X 70mm
I/O organized in 3 segments of 26 pins each
96 bit Boundary-scan Register Length
Each segment can be independently bypassed
Medium-speed 10MHz TCK for high reliability at the best cost/performance ratio
Each pin is independently programmable for sense, drive, bi-directional, and tri-state operation
Fully-compatible JTAG/IEEE 1149.1 Test Access Port (TAP)
Drives 3.3V logic, 5V tolerant
Operating power 3.3V
Fast, Low impedance, unprotected I/O channel driver can be used as a clock signal (fast I/O drivers, at low impedance,
without protection, can be used as clock signals)
• Optional LVDS TCK interface can be used in large fixtures to avoid noise and skew problems.
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General Description
The BSPIO-78TTLU provides bi-directional parallel-scan access to up to 78 TTL electrical nodes for the driving
and sensing of logic values. This module increases the effectiveness of boundary-scan testing, enabling
verification of all board connectors and within logic clusters. The BSPIO-78TTLU is available in two versions, both
of them compatible with the standard DIN41612 female connectors in a test fixture. One version, the BSPIO78TTLU-A1, is primarily intended for test fixtures with few BSPIOs, and contains a standard TTL interface on the
TAP’s TCK signal. This module facilitates boundary-scan interconnection testing using direct connection to the
JTAG/IEEE 1149.1 Test Access Port (TAP). The other version, the BSPIO-78TTLU-A2, is intended for test fixtures
with many BSPIOs and contains a balanced LVDS interface on the TAP’s TCK signal. This module facilitates
boundary-scan interconnection testing using a small interface connection to a JTAG/IEEE 1149.1 TAP.