RedLux WLI0 pages

Reliable, Precise and Affordable 3D Surface
Profilometry for the Shop Floor and beyond. 
RedLux WLI (White Light Interferometer)
surface profilers use a measurement technique
known as ‘low-coherence scanning white light
interferometry’ to provide rapid, precise and
non-contact 3D measurement of machined
surfaces with sub-nanometre resolution.
The WLI is the ideal inspection and test
instrument for production / shop-floor use. The
robust internal design coupled with proprietary
anti-vibration image acquisition, ensures
accurate and reliable operation in conditions
where vibration has previously been a problem.
The combination of an intuitive user interface
with complete automation keeps measurement
cycle times to an absolute minimum, enabling
an improvement in both production yield and
throughput.
Configured to support a wide variety of
applications, the RedLux WLI is wellsuited to measure the form and finish of a
range of components from highly polished

specular surfaces to non-reflective materials incorporating
automatic fringe-find & focus as standard. Productionintegrated or standalone operation could not be easier.

Typical Measurements / Applications
•t Surface finish / roughness
•t Form removal & residual analysis
•tFlatness
•tStep-height
•t Defect inspection
•t Film thickness

Key features
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Sub-nanometre resolution
Complete automation for shop-floor use
Easy to use – auto focus / fringe-find
Rapid throughput / measurement time
Vibration resistant
Durable and low-maintenance design
Customisable field-of-view / resolution
Wide range of applications
Extensive library of analysis tools
Scripting environment makes automation and post tt
analysis routines quick and simple to set up
Optimum price to performance ratio

www.redlux.net/WLI