LIV1000 pages

LIV100

LIV Laser Diode Characterization System

HIGHLIGHTS

APPLICATIONS

High throughput

Pre-packaging laser diode testing

Pulse duration

150ns-2ms

Production quality assurance

Maximum current

200A

R&D

120A and 40A also available

OEM

Current rise time

400ns

FIELDS OF APPLICATION

The LIV100 laser diode measurement
system is a µC-controlled autonomous
system comprising an analogue-digital
signal processing unit (ADSPU), current
driver and an integrating sphere. The LIV
measurement consists of pulsing the laser
diode with a specific current and
measuring the output light power (L) via
the integrating sphere - photodiode transimpedance amplifier combination and
also the voltage drop (V) across the laser
diode. The current is then increased by a
fixed amount and the measurement
repeated. This is repeated many times to
produce a staircase increase in current
and measurements of L and V for each
current. The data are subsequently used
to generate L/I and V/I curves giving
specific information about the quality of the
laser diode under test.

LIV100_Engl_RevA3.doc

PRINCIPLE OF OPERATION

The LIV100 has been designed for testing
laser diodes at the chip or bar level prior to
packaging. Thus the manufacturer can
determine the quality of the individual laser
diodes before spending the time and
resources on packaging defective or
deficient diodes. Since proper temperature
control cannot be realized on the naked
laser diode chips, the LIV100 performs all
tests using current pulses as short as
150ns in duration. This avoids any
significant thermal loading which may
affect results.

Artifex Engineering
Dortmunder Str. 16-18
26723 Emden, Germany

Tel: +49-(0)4921-58908-0
Fax: +49-(0)4921-58908-29

mail: info@afx-eng.com
http://www.afx-eng.com