Laser Diode Characterization System0 pages

LIV in the fast lane!
Laser Diode Test System LIV100
Highlights:
Strong: up to 400A
Fast: 50ns1 rise time
High throughput
Our offer in Detail:
The LIV100 is a powerful test system for use in the lab as well as for OEM applications, ideal for
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Diode characterization at the chip or bar level
Quality control of incoming goods
OEM
We offer this instrument with a variety of end stages covering current ranges from 1A to 400A.
A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 then
takes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test is
passed, the unit drives the laser with the given
prescription and performs the data acquisition
and storage. Many laser diodes of the same
type may now be tested in this manner with
very high throughput. The measurement cycle
takes less than 0.3s for 200 current steps2
including the data tranfer to the host computer.
Specifications
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Current: up to 400A
Rise time: <50ns1
Throughput: 0.3s per diode2
USB-controlled via command list
Up to 6 channels of synchronized data acquisition
Optical spectrum: resolution ~0.1nm
Your problem is our challenge – flexibility is our standard:
LIV100_110502_Engl.doc
We will gladly adapt, for example, the wavelength or the current to suit your application.
Let us know your requirements.
Artifex Engineering e.K.
Dortmunder Str. 16-18
26723 Emden, Germany
General Manager: Dr. Steven Wright
Registry number: HRA 200036
Tel: +49-(0)4921-58908-0
eMail: info@afx-eng.com
Web: http://www.afx-eng.com/