Single probe Double Layer Detection System for solar wafers (Solar sensors WF12IG453S)0 pages

WF12IG453S SENSOR

SINGLE PROBE DOUBLE LAYER DETECTION SYSTEM

for crystalline Solar Wafer

WF12IG453S

DOUBLE SHEET DETECTOR A100

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K'JL*M>tLEC«KJNIC

XA100-S

• Double Layer Detection for crystalline Solar Wafers

• Eddy current measurement principle

• Sensor size M12x1

• Very fast response time - less than 20 ms

• Analog output for connection to PLC