Single probe Double Layer Detection System for solar wafers (Solar sensors WF14x15AQ453S)0 pages

WF14x15AQ453S
Page 1 / 5

Rev. 1.5 / 08.02.2011

Double cell detection of crystalline solar cells

Eddy current measurement principle

For mounting in „Schmalz Wafer Gripper SWG“

Very fast reaction time – less than 20 ms

Analogue output signal for connection to PLC

2

3

1
1 – Crystalline Solar cell
2 – Schmalz Wafer Gripper SWG
3 – Roland Sensor WF14x15AQ453S

ROLAND ELECTRONIC GMBH · Otto-Maurer-Str. 17 · D-75210 Keltern · Telefon +49 (0)7236 9392-0 · Telefax +49 (0)7236 9392-33