Phenom XL0 pages
Specification Sheet | Microscopes
Phenom XL
Desktop SEM for large samples
Phenom XL
Throughput and speed
All-in-one imaging and analysis system
Fastest loading cycle in the world
Largest sample size in its class
Secondary electron detector
Motorized scan of samples up to 100 mm x 100 mm
Detection of low-energy electrons for topographical
and surface information
Fully Integrated EDS
Never lost navigation
Elemental analysis is as easy as imaging, with fully
integrated EDS
Permanent optical overview for swift navigation to any
region on the sample