FPI XRF-2000 X-Rays Analyzer for heavy metals in process gas0 pages

Heavy Metal

XRF-2000

Measuring Principle
USB Port
Wireless

cpu

STORAGE

DIGITAL
SIGNAL
PROCESSOR
AMP

PRE-AMP
DETECTOR

X-RAY
SOURCE

X-Ray safely
Shutter
Duter Electron
Fills Vacancy

Ejected
Electron

K

L

M

Fig.5.1: Measuring principle of X-ray fluorescence

Features and Benefits
⊙ Simultaneously analyzing 28 most regular heavy
metal elements, others scalable
⊙ High sensitivity, lower detection limit down to ng/m

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⊙ Truly continuous and non-destructive measurement,

TECHNICAL DATA
Model

XRF-2000

Technical Principle
Installation type

X-ray Fluorescence
Extractive

Measuring Element

Hg, Pb, Cd, As, Cr, Cu, Zn, Ni, Fe, Ag, Mn,
Ca, K, etc. totally 28 heavy metal elements

Measurement Range
Detection Limit
Linearity
Accuracy
Gas Temperature
Gas Pressure
Sampling &
Analysis Period
Filter tape
consumption
Size
Weight

no pretreatment needed

0~2000μg/m 3
0.1μg/m 3
Correlation coefficient>0.99
<1.5%(Pb)
(-20~600)℃
(-20~50)KPa
10~120mins(Selectable)
Replace every 3 months
1500x1200x480mmHxWxD
Around100kg

⊙ No chemical, no liquid waste, reliable and less maintenance
⊙ 13 patents borne by the single analyzer
⊙ Radiation safety certified

X-rays used to expel tightly held electrons from the inner
orbitals of the atom. The removal of an electron in this way
makes the electronic structure of the atom unstable, and
electrons in higher orbitals ‘fall’ into the lower orbital to fill the
hole left behind.
Each of these transitions yields a fluorescent photon with a
characteristic radiation equal to the difference in energy of the
initial and final orbital. The fluorescent radiation is then
analyzed by separating the characteristic wavelengths
(qualitative) and detecting intensity of each characteristic
radiation (quantitive).

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