Wafercheck 1500 pages
WaferCheck 150
PICOQUANT
Semiconductor Wafer Analyzer
Excitation with diode laser pulses as short as 50 ps (FWHM)
Excitation wavelengths: 375 to 810 nm
Emission wavelength selection with easily exchangeable filters
Detector options: PMT or MCP-PMT
Data acquisition based on Time-Correlated Single Photon Counting
Integrated laser power meter
4
10
3
10
2
10
intensity [counts]
10
1
4
8
12
16
20
time [ns]
24
28
32
36
40
Applications
Monitoring Time-Resolved Photoluminescence (TRPL) from semiconductors
Online semiconductor process analysis and quality control
Time response characterization of optoelectronic devices
Specifically designed for GaAs/GaN wafers (e.g. solar cells)
Photovoltaic
LEDs, OLEDs