Ion Beam Profiler0 pages

Ion Beam Profiler
Featuring:
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Low Light CMOS High-Speed Camera
Large, Customizable Microchannel Plate
Simple Acquisition of Analog or Digital Images
Immediate Feedback of Ion Loss and Optimization

New Upgraded Design
PHOTONIS has combined two of our
superior detection and analysis
technologies into a new digital ion beam
profiling unit. The new Ion Beam Profiler
combines a large Microchannel plate (up to
120mm) in a complete assembly with the
PHOTONIS Nocturn, a high-resolution
digital CMOS low-light camera which is
immune to sudden light damage. Together
these highly sensitive imaging components
offer a detailed image of your instrument’s
ion beam, allowing system designers to
identify and correct any areas of ion loss
that had previously been overlooked. This
new diagnostic tool allows the instrument to
be designed to maximize the amount of ions
collected for a superior analysis.
Tracing the Path
Ion optics modeling software is often used
to design and predict the ion path within a
mass spectrometer. The conventional
method for aligning an ion beam consists of
scanning the beam over a Faraday cup or
electron multiplier, integrating the current,
and finding the settings which produce the
highest signal. However, ion trajectories can

be influenced by many factors which are not
considered in the model. Efficiently
transporting ions from the source through
the mass filter is critical for maximizing
instrument sensitivity.
The new PHOTONIS Ion Beam Profiler can
visualize the location of any charged particle
(Ion, Electron, UV, photon or soft X-Ray),
enabling the instrument designer to ensure
all available signal ions are collected. The
unit can capture images from the phosphor
screen at up to 100 frames per second and
store them on a PC for collaboration and
comparison testing. A strobe trigger is
available to synchronize the camera to a
specific event.
Versatile Applications
The new Ion Beam Profiling unit can be
used in wide range of applications, including
ion optic model verification, Imaging TOF,
VUV Spectroscopy and high energy physics
as well as ion beam profiling. The unit can
be custom-fit with a specific microchannel
plate and electro-optic housing to fit your
unique application.

PHOTONIS USA, Inc.  660 Main Street, Sturbridge, MA 01566 USA 
T: +1 (508) 347 4000   E: sales@usa.photonis.com  W: www.photonis.com 

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typical characteristics as individual product performance may vary. Customers should verify that they have the most current PHOTONIS product information before placing orders. No claims or warranties are made
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