ESCA+0 pages
tyOmicron
:_Nano Technology
High-performance
Analysis
Reliable, Fast, Multitechnique Platform
Small Spot XPS for High Speed Depth Profiling
'Dual Beam' Charge Neutralisation
Fully Integrated Software Control and Automation
Rapid Quantification within MultiPak™ or CASA XPS
Integrated Sample Preparation Options
Imaging XPS Option
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