AFM for SEM0 pages

Super-flat AFM for SEM
Have you ever wanted to get fast 3D information in
SEM? Kleindiek and Nanosurf have the plug-and-play
retrofit solution for you.
The combination of Atomic Force Microscopy (AFM)
and Scanning Electron Microscopes (SEM) opens
exciting new possibilities. SEM’s are widely used for
analytics in the micrometer and nanometer range
and AFM techniques are useful for investigating the
surfaces and characteristics of different materials down
to nanometer detail.
Kleindiek Nanotechnik has developed a slim, compact
and flexible scanner that allows AFM to be performed
in SEM. Combined with Nanosurf’s SPM controller and
easy-to-use control software, information on lateral
dimensions and material from SEM inspection can be
readily complemented by precise topographical and
force information in-situ.
The unique and effortless availability of these two
sets of data brings new value-added functionality
to existing tools and reduces experiment cycle time,
thereby increasing research throughput.
The AFM system is compact and slim enough to fit
inside any SEM and is even compatible with your loadlock if your SEM is fitted with one.
The system also works stand-alone in air.

Nanosurf

Microscopy Made Easy

YO U R A D VA N TAG E S
3D information from simultaneous
SEM and AFM pictures
Notably compact (height 10 mm)
Simple to operate
Load-lock compatible
Extremely stable operation
Easy sample and tip exchange
without laser adjustment
Can be used in combination with
micromanipulators and other
in-situ and ex-vivo tools
Works in air and in SEM

Atomic Force and Scanning Electron Microscopy
Atomic Force and Scanning Electron Microscopy