Models 707B and 708B - The New Industry Standards for High-Speed Switching0 pages

New semi test applications demanding greater
throughput and maximum low current performance?

Time to demand the new industry standards for high-speed switching.
Semiconductor test applications that require higher-speed test
sequences and greater overall throughput demand our newest
high-speed semiconductor switch mainframes, the six-slot
Model 707B and the single-slot Model 708B. They’re ideal
companions for Keithley’s line of high-performance matrix
switch cards, including our industry-standard, ultra-lowcurrent Model 7174A Air Matrix card and the Model t
7072-HV High-Voltage Semiconductor Matrix Card, which
can deliver up to 1300V to any pin on the DUT or probe card.

Even more important, these new switch mainframes t
help you test faster, more flexibly, and more cost-effectively
than ever before:

Switch I-V and C-V instruments while
maintaining maximum low-level
performance

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NEW on-board Test Script Processor (TSP®) for
distributed processing and control: You don’t need
a central controller to direct test system operation—just
define a test script or sequence and store it in the TSP’s
memory, then execute it on command, for a dramatic
throughput increase. Their TSP and TSP-Link architecture
make the Models 707B and 708B ideal test companions for
our Series 2600A System SourceMeter® instruments and
ACS and S530 testers

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NEW front panel design for easier manual operation:
Our updated front panel interface simplifies manual
programming and lets you confirm switch status at a glance.

Source and measure up to 1300V or 1A
without reconfiguring cables between tests

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Compatible with all semiconductor
parametric analyzers

nt Replacements

for Keithley’s Models 707A
and 708A mainframes

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NEW interfaces for greater flexibility: Now you can
communicate with or program either mainframe remotely
via the LXI/Ethernet connection, USB port, GPIB, and our
ultra-fast TSP-Link® inter-unit communication/triggering
bus, which simplifies system scaling.

Low-leakage matrix configurations with up
to 576 crosspoints per mainframe

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NEW digital control platform for higher throughput:
This new platform supports dramatically faster commandto-connect speeds for higher test throughput. Even in the
slowest mode, you can boost throughput by as much as 40%
without any code changes.

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