NRS-5000/7000 Series0 pages

2010/03/19 Rev. K
Specifications
NRS-5100
Spectrograph
Spectrograph (Focal length)
Scanning mechanism
Low wavenumber attachment
Wavenumber range
(Raman shift)
Maximum resolution
Grating
Max. No. of mountable grating
UV upgrade
Rejection filter
Rejection filter switching
Beam splitter
Detector
Standard detector
Optional detectors
Dual detector switching
Laser
Laser
Maximum number
of laser mounted at a time
Microscope
Microscopic observation
Confocal optics
DSF (Dual Spatial Filter)
SRl (Spatial Resolution Image)
Objectives
Standard sample stage
Optional sample stages
SPRIntS imaging
Autostage imaging
Macro measurement unit
Auto-alignment feature
SGI (slit guide image)
Neon lamp
Safety feature
Software
Standard function
Functions included in
SPRIntS imaging and
autostage imaging
Optional programs
Anti-vibration table *9
Dimensions & Weight
(Main unit only)
Power requirement

NRS-5200

NRS-7100

NRS-7200

Aberration-corrected Czerny-Turner monochrometer (f = 300 mm)
Aberration-corrected Czerny-Turner monochrometer (f = 500 mm)
High-precision direct drive
Standard
Standard
None
None
(Excitation WL: 400 ~ 800 nm)
(Excitation WL: 400 ~ 800 nm)
50 ~ 8000 cm-1 *1

10 ~ 8000 cm-1 *2

cm-1

50 ~ 8000 cm-1 *1

5 ~ 8000 cm-1 *2

cm-1

1
(532 nm excitation, 1800 gr/mm, 1024 pixel CCD)
(532 nm excitation, 1800 gr/mm, 1024 pixel CCD)
0.7
0.4 cm-1 optional (532 nm excitation, 2400 gr/mm, 2048 pixel CCD)
0.3 cm-1 optional (532nm excitation, 2400 gr/mm, 2048 pixel CCD)
1800 gr/mm (Option: 3600, 2400, 1200, 600, 300, 150 gr/mm)
3
4
Factory option for UV laser excitation (including UV optical elements and UV light observation camera) *3
532 nm notch filter (Option: Notch filters and edge filters for other excitation wavelengths)
Manual exchange (Option: automated 8-position switching mechanism)
Beam splitter with automated switching mechanism (Option: Dichroic Mirrors, Max. 2 dichroic mirrors can be mounted) *4
4-stage Peltier cooled CCD detector (UV-NIR range, 1024 × 256 pixel)
4-stage Peltier cooled CCD detector (high-resolution, 2048 × 512 pixel), Liquid-nitrogen-cooled InGaAs detector (for 1064 nm excitation laser, 1024 pixel)
Factory option (required when using 2 detectors)

NRS-5000/7000 Series
Laser Raman Spectrometers

532 nm, 50 mW (Option: 244 *5, 266 *5, 325 *5, 355 *5, 442, 488, 514.5, 633, 660, 785, 1064 nm)
Internal: Max. 2*6, External: Max. 6 (VIS-NIR laser: Max. 3, UV laser: Max. 3), Total: Max. 8 lasers, 9 wavelengths
Standard:High-resolution built-in CMOS camera (Option:binocular, trinocular, polarization observation, differential interference, transmission illumination)
Standard
Standard *Not available for UV upgraded model
Standard *Not available for UV upgraded model
5×, 20×, 100× objectives (Option: Long working distance type, UV type, NIR type)
Manual XYZ stage (operable distance X: 75, Y: 50, Z: 30 mm)
XY autostage with joystick accessory (travel range X:100, Y:70 mm, 0.04 μm step), Z autostage (travel range Z:30 mm, 0.1 μm step)
Factory option (including VertiScan, high-speed data import, 3D imaging measurement, Z autostage, autofocus function)
Factory option (including imaging measurement, 3D imaging measurement, XYZ autostage, autofocus function)
Factory option (SPRIntS imaging system and the Macro measurement unit cannot be provided simultaneously)
Laser beam auto-alignment, Raman scattering auto-alignment
Standard
Standard (for wavenumber correction)
Integrated sample chamber laser interlock, laser light-path protection (Class 1 compliance)
Point measurement, wide spectral-band measurement, basic spectral data processing functions, search/functional group analysis (Sadtler KnowItAll),
cosmic-ray removal, auto-fluorescence-correction, wavenumber correction, sensitivity correction, JASCO canvas (printing function), validation, user help function
Omnifocal image, Real-time display of spectrum, chemical image and current measurement point, multi-image map,
auto-focus (supporting both sample image contrast and laser focus algorithms), imaging analysis (including Peak height (ratio), Peak area (ratio), Peak shift,
PWHH), PCA mapping, 3-D imaging (including 3-D Raman image display, 3-D image slice display)
High-throughput screening measurement *7, interval measurement analysis, stress analysis *8, carbon analysis, polysilicon crystallinity evaluation, 2D correlation
Option (air source for anti-vibration table: nitrogen gas or air source, secondary pressure 0.25 - 0.3 MPa)
880(W) × 890(D) × 670(H) mm
1360(W) × 890(D) × 670(H) mm
1060(W) × 1220(D) × 670(H) mm
1540(W) × 122 (D) × 670(H) mm
About 200 kg
About 240 kg
About 230 kg
About 270 kg
AC100 V ±10 V, 200 V ±20 V, 200 VA

*1 At 532 nm excitation wavelength with the standard rejection filter.
*2 At 532 nm excitation wavelength with the low wavenumber attachment.
*3 UV laser, edge filter for UV laser, and UV objectives are additionally required.
*4 One dichroic mirror can be mounted when either the UV upgrade or the SPRIntS imaging option is configured.
No dichroic mirror can be utilized when both the UV upgrade and the SPRIntS imaging options are fitted.
*5 The specifications are partially different from the standard model when UV laser is used.
*6 The laser may not be internally mounted due to the specification of the laser.
*7 Autostage imaging option is required.
*8 SPRIntS imaging option or autostage imaging option is required.
*9 Raman system must be placed on anti-vibration or equivalent table.

Specifications are subject to change without notice.

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