UV/VIS CCD spectrometer (190-980nm).0 pages

J&M Analytik AG
Willy-Messerschmitt-Straße 8
73457 Essingen
Datasheet spectrometer MCS CCD UV/NIR 2098
Type
Unit
Value
µm
MCS-CCD
UV/NIR
SMA 905
70 x 1400
Module
Connector
Entrance slit with
cross section
converter
Grating
Blaze wavelength
Hamamatsu S7031
Total Pixels
Wavelength range
Pixel distance
Opt. Resolution
according to USP
Wavelength accuracy
Repeat accuracy
Wavelength
temperature drift
Scattered light
Dimensions [LxDxH)
Baseline drift
S/N ratio
*1)
*2)
L/mm
nm
nm
nm/pixel
nm
248
250
1006S
1044x64
200…980
~0.8
<4
nm
nm
nm/°
C
< 0.5
< 0.1
< 0.01
%
mm³
AU/h
AU
< 0.1 @ 340nm
~ 177 * 128 * 75
5*10E-04*1)
< 4*10E-05*2)
Baseline drift will be measured at 254 nm after 10h warm up @ 21°
C±2° ambient
C
temperature according to ASTM E685
Noise will be measured at 254 nm after 10h warm up @ 21°
C±2° ambient
C
temperature according to ASTM E685, without methanol flow with the following settings:
•
•
•
•
Integration time <100ms
Pixel bunching 5 (5x0,8nm = 4nm)
Integration time x accumulation <2 sec.
Detector saturation ~ 80%,