Thermo Scientific I3710D-XD40 pages

Product Specifications

The Thermo Scientific camera
I3710D-XD4 is a high gain, gated
intensified CID based camera consisting of a model 3710D solid
state RS-170 version camera with
12 x 13.7 micron (4:3 aspect ratio)
pixels, fiberoptically coupled to a
high performance XD-4 image
intensifier tube from DEP.

Thermo Scientific I3710D-XD4
Intensified Solid State Camera

Designed for Ultra low light
The I3710D-XD4 is a gated intensified
CID based camera consisting of the
3710D RS-170 version camera with
12 x 13.7 micron pixels, fiberoptically
coupled to a high performance 18mm
XD-4 Image intensifier tube.
The standard XD-4 tube has an S-25
photocathode with P43 phosphor and
is equipped with an integrated power
supply for high speed gating allowing
for shutter intervals <50ns and
exhibits low noise / high gain performance with typical light gain of
30,000X.
Maximum Flexibility
Intensifier gating may be controlled
automatically, or manually via control
knob or with external TTL input.
Intensifier gain is manually controlled
via the Gain control knob, or by the
AutoGain feature. The MCP uses a low
noise photocathode sensitive from
400nm to at least 800nm.
Internal adjustments allow for control
of black level setup, edge enhancement and 2X video gain boost.
Options include digital control, optical coupling, Autogate/Autogain only,
Progressive Scan, and CCIR format.
The I3710D-XD4 camera features a
2:1 interlace scan 776(H) x 512(V)
CID array with 12 x 13.7 micron pixels
in a compact remote head connected
to the camera control unit via flexible
2 meter cable.

Part of Thermo Fisher Scientific

Features:
. CID (Charge Injection Device)
High resolution, High MTF
. High speed gating to 50ns minimum
. Excellent image at 7 x 10(5) rads/hr
. 18mm DEP XD-4 image intensifier
. Sensitivity 5 x 10 fc at faceplate
. Typical 30,000X light gain
. Precise edge detection
. Auto Gate/Gain with manual control
. RS-170, 2:1 Interlace scanning format
. 12 x 13.7 micron contiguous pixel
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Applications:
. Extremely low light level inspection
and measurement
. Remote gaging, metrology
. Florescence microscopy
. X-Ray Imaging
. Machine vision
. Spectroscopy