T9400 pages
Astronics Test Systems Inc.
Talon Instruments™
T940
50 MHz Digital Resource Module
The Talon Instruments™ T940 Digital Resource Module (DRM) provides up to
64 high-performance digital I/O channels in a space-saving single-wide VXI 4.0
compatible module. The T940 operates at data rates up to 50 MHz with 1 ns
edge placement, variable slew rates, and <3 ns channel-to-channel skew.
Key Features
•t 50 MHz digital stimulus and
response with 1 ns edge placement
resolution
•t Engineered for reliability with
an advanced thermal design,
temperature monitoring, and
over-temperature shutdown
•t Innovative software tools
to speed test development
•t Scalable design supports
synchronized digital test systems
from 24 to 768 channels
•t High-speed data sequencer
provides control of stimulus/
response patterns
•t Optional software tools simplify
legacy replacement and preserve
TPS investment
Product Information
The T940 series of digital modules for the
VXIbus provides the basis for a complete
state-of-the-art digital solution at the
subsystem level. The T940 is the solution
for both legacy digital replacement and
new test stations to be built for digital
test including aircraft/avionics, weapons
systems, spacecraft, semiconductors and
medical devices.
We exploit the VXI 3.0 and 4.0 platforms
to produce highly-capable and reliable
digital subsystems that are backed by our
proprietary digital sequencer architecture.
The T940 has been designed using Field
Programmable Gate Arrays (FPGA) and
pin-driver technologies plus an advanced
sequencer, providing a choice of fixed or
variable driver/receiver personality modules
to create flexible digital instrumentation.
Mix and Match Driver/Receiver Modules
for Value
When configuring a digital subsystem,
combine an appropriate VXI mainframe/
controller, configured T940 modules that
include the Digital Resource Module
(DRM) and your choice of Driver/Receiver
(DR) daughter cards to meet the physical
interface requirements, and software.
T940 DRM features dual sequencers
that can each operate in standalone or
linked modes automatically with software
commands.
DR card types include a full selection of
variable-voltage and fixed-voltage types,
including LVDS, LVTTL, and RS-485.
949.859.8999; 800.722.2528; atssales@astronics.com; www.astronicstestsystems.com
Copyright © 2014 Astronics Test Systems Inc.
Applications for a Digital Subsystem
The T940 modules form the backbone
of a digital subsystem that may include
switching, analog instrumentation, and
even an RF subsystem.
The proven VXIbus instrumentation
platform is a time-tested approach for
facilitating the integration of these different
technologies at the device level by allowing
the free mixing of T940 modules with other
VXI modules for added functionality. In
addition, the T940 modules can be preintegrated at the subsystem level suited to
a specific application.
The Racal Instruments™ 1263 series
and 1261B series mainframes, switching
products, and other instrumentation
integrate with the T940 to meet many
stimulus/response needs.
If requirements are provided to us, we
can propose either a subsystem or a fully
integrated system to perform functional
testing on a variety of complex Devices
Under Test (DUTs), including satellites,
weapons systems, aircraft LRUs/SRUs,
and certain classes of semiconductor
devices.
We are uniquely positioned to provide
solutions from the device level to the
turnkey system level, including all hardware
and software spanning the test development tools, including the Test Program Set
(TPS) itself.
Designed for High Reliability
The T940 employs comprehensive thermal
design to ensure reliability with excellent
cooling, monitoring, and protection.