UHV NANOPROBE0 pages
UHV NANOPROBE 175-V02/07.06
UHV NANOPROBE
Four Independent
Scanning Probe
Microscopes
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4-Point Transport Measurements on Nanostructures
Electrical Contacting of Nanodevices
STM-Based Safe & Non-Destructive Tip Approach
Full STM Capability
High-Resolution, < 4 nm SEM Imaging for
Rapid Tip Navigation
• High-Resolution, < 10 nm SAM Imaging for
Chemical Mapping
• True UHV Operation for Clean & Artefact-Free Surfaces