Exicor® GEN50 pages
BIREFRINGENCE MEASUREMENT
Exicor® GEN5
P R O D U CT B U LLE T I N
ULTRA LOW-LEVEL BIREFRINGENCE MEASUREMENTS
in volume, the Exicor MT is used in all of our visible wavelength
OF LCD MATERIALS
systems and custom OEM applications. It provides excellent
measurement performance while offering the convenience of
Sub-Nanometer Level Metrology
easy removal and replacement for maintenance.
Exicor birefringence technology has been adopted by the
world’s leading optics manufacturers to measure birefringence
with unsurpassed accuracy and repeatability. With a
retardation resolution of only 0.005 nm, Exicor is uniquely
suitable for ultra-low retardation measurement applications
and stress estimation.
Repeatabilty, Assured
Hinds Instruments’ worldwide customer base has condence
in Exicor technology and our measurements. We include
a low level retardation sample with high homogeneity and
extremely low retardation with every GEN5 LCD system. The
automatic offset feature of all Exicor systems may be set to
remove traces of noise and provide retardation measurement
Exicor GEN5 LCD
repeatability to 0.005 nm. A solid, dependable reference
Following years of experience working with the world’s
sample at this low level ensures your measurements are
leading manufacturers of optical materials, Hinds Instruments
accurate... every time.
introduced the Exicor 1500AT system for measurement of large
surface area optical materials such as those used in LCDs
(up to 1500mm x 1500mm). As LCD materials specication
have matured specialized systems that are scaled to
the industry needs have become necessary. The
smaller Exicor GEN5 LCD is built on the core of the
successful Exicor 1500AT design and is scaled
to measure Generation 5 (and smaller) LCD
display components.
The growing LCD industry demands the
highest sensitivity available in order
to reliably produce precision LCD
display components. The Exicor
GEN5 LCD is equipped with our
popular Exicor MT system. Now built
Technology for Polarization Measurement
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