RAYEX® for Silane X-Ray Measuring System for Silane Extrusion Lines for Low and Medium Voltage Cables - See more at: http://www.zumbach.com/downloads/zumbach-literature/#sthash.I38jrne2.dpuf0 pages

RAYEX® X-Ray Measuring System for Silane Extrusion Lines
for Low and Medium Voltage Cables
General
RAYEX® systems have been sold since 1996 also for applications outside of CV-tubes.
A special version of the model RAYEX® 160 at moderate cost is available for monitoring the thickness and eccentricity of insulation and semi-conductive layers in Silane processes (Monosil, Sioplas etc.) The system measures at
the same time outside diameter and ovality.
Thanks to its unique concept with an ultra-stable UMX-source and microfocus beam, the RAYEX® can measure
extremely thin semiconductors on small conductor sections with high precision. This is a significant feature to
ensure a high cable quality and lifetime.

Description
The system consists of following main components:
1. Measuring Head
The x-ray head comprises two identical scanners, each with an x-ray source and a detector as well as the
corresponding scanning and control system.
2. Support assembly
The support assembly serves as mounting base for the two x-ray scanners and ensures at the same time
that no x-ray scatter reaches the outside. The two openings of the protection tube are sealed by a special
labyrinth for the x-rays.
3. Processor and display unit
The electronic cabinet contains the USYS-RAYEX real time processor and an industrial colour screen with a selfexplanatory display of the complete cable section.
Programmable for any cable construction, with or without semiconductors.

Integration into Silane Extrusion Lines
The RAYEX® measuring head on the support assembly is typically mounted between the cross head and the
cooling trough.
It is recommended to mount it on a mobile support and rail system, so it can be retracted longitudinally or sideways with the cooling trough in case of works on the cross head.
SCAN STD. MODE

Absolut Values

Product 1

Stats. ON

1997-01-10 13.22.00

DIAMETER AVG

+Y

240 mm

24.87

+X
0.95

0.84

THICKNESS AVG

5.00

OUTER SEMI

5.06

0.80

0.78

0.87

0.79

0.85

INSULATION

v

v

5.05

INNER SEMI

0.83

5.19

4.95

0.65

0.67

-X

ECCENTR. TOTAL

-Y

v

0.23

F1
F6
MORE

DIAMETER

Extruder

F2

THICKNESS

F3

ECCENTR.

F4

BAR-GRAPH

F5

MAIN DISPLAY

F7

PRODUCT

F8

OPERATION

F9

STATISTICS

F10 MENU

RAYEX - Scanners x and y
Cooling Trough

Cross Head

Retract
Rail

Technical Data

•
•
•
•

Cable outside diameter
Max. insulation thickness
Conductor section
Min. semiconductor thickness
Material

•
•
•
•
•

Moderate cost
Ultrastable UMX source
Microfocus beam
Measures semiconductors down to 0.3 mm or less
(depending cable geometry)
Simultaneous Twin-Scanning in X and Y
Easy to understand screen display
No safety problems
Checking/Calibration system ISO 9000
Reference scan feature

For detailed data, please refer to general RAYEX® documentation.

: 10 - 80 mm
: 20 mm
: from 16 mm2 upwards
: 0.3 mm
: All current materials
for Silane processes
RAYX.009.0004.E
15.04.1999

Outstanding Advantages